Radiation Hardening by Design (RHBD) for Cryptographic ASICs

Engineering silicon architectures immune to Single Event Upsets (SEU), Single Event Latchup (SEL), and Total Ionizing Dose (TID).

The Physics of Cosmic Radiation on Cryptographic Dies

In space, high-energy cosmic rays and solar protons pass through silicon dies, ionizing charge that flips memory bits (Single Event Upset - SEU) or triggers destructive high-current short circuits (Single Event Latchup - SEL). A bit flip in an encryption key register completely corrupts communications. SpaceHSM deploys Radiation Hardening by Design (RHBD) with triplicated registers and majority voting logic.

Total Ionizing Dose (TID) Qualification

Tested under cobalt-60 gamma radiation sources, SpaceHSM retains full parametric performance past 100 krad(Si), ensuring reliable operation for 15+ year missions in geostationary orbit (GEO) and high-radiation MEO orbits.

Silicon-on-Insulator (SOI) Substrates: Physically isolating transistor wells to eliminate parasitic latchup paths.
Triple Modular Redundancy (TMR): Triplicated voting logic on all internal cryptographic registers and state machines.
TID > 100 krad(Si) Tolerance: Engineered to withstand cumulative solar particle events and Van Allen radiation belts.
Error-Correcting Memory (ECC): Scrubbing internal RAM arrays continuously to repair cosmic ray bit flips.

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